"A. Martin, P. O'Sullivan and A. Mathewson" appeared in Books and Chapters

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"A. Martin, P. O'Sullivan and A. Mathewson" appeared in Books and Chapters

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Chapter	Author(s)	Book	Book Authors	Year	Publisher
Assessment of a Unipolar Pulsed Ramp for the Characterisation of MOS Gate Oxide Reliability	A. Martin, P. O'Sullivan and A. Mathewson	1995 International Integrated Reliability Workshop: final report, Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 /	Ieee Reliability Society	[1996], ©1996.	IEEE Service Center,
Assessing MOS Gate Oxide Reliability on Wafer Level with Ramped and Constant Voltage and Current Stress	A. Martin, J. Suehle, P. Chaparala, P. O'Sullivan, A. Mathewson and C. Messick	1995 International Integrated Reliability Workshop: final report, Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 /	Ieee Reliability Society	[1996], ©1996.	IEEE Service Center,
Chapter	Author(s)	Book	Book Authors	Year	Publisher

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