"B. G. Batchelor" appeared in Books and Chapters

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Chapter	Author(s)	Book	Book Authors	Year	Publisher
Like Two Peas in a Pod	B. G. Batchelor	Machine Vision for the Inspection of Natural Products	Mark Graves; Bruce Batchelor	2003	Springer London
Intelligent Image Processing	B. G. Batchelor	Machine Vision for the Inspection of Natural Products	Mark Graves; Bruce Batchelor	2003	Springer London
Die Automatisierung visueller Prüfvorgänge zur Sicherung der Produktqualität	B. G. Batchelor	Herausforderung Qualität: 22. IPA-Arbeitstagung 14. und 15. November 1989 in Stuttgart	Hans J. Warnecke	1989	Springer Berlin Heidelberg
Setting the Scene	B. G. Batchelor	Pattern Recognition: Ideas in Practice	Bruce G. Batchelor	1978	Springer US
Classification and Data Analysis in Vector Spaces	B. G. Batchelor	Pattern Recognition: Ideas in Practice	Bruce G. Batchelor	1978	Springer US
Social Aspects of Pattern Recognition	B. G. Batchelor	Pattern Recognition: Ideas in Practice	Bruce G. Batchelor	1978	Springer US
Image Acquisition and Processing Techniques for Industrial Inspection	B. G. Batchelor; G. E. Foot	Computer Integrated Manufacturing: Current Status and Challenges	I. Burhan Turksen	1988	Springer Berlin Heidelberg
Final Remarks	B. G. Batchelor; M. Graves	Machine Vision for the Inspection of Natural Products	Mark Graves; Bruce Batchelor	2003	Springer London
Commercial Vision Systems	B. G. Batchelor; D. W. Braggins	Computer Vision: Theory and Industrial Applications	Carme Torras	1992	Springer Berlin Heidelberg
Basic Machine Vision Techniques	B. G. Batchelor; P. F. Whelan	Machine Vision for the Inspection of Natural Products	Mark Graves; Bruce Batchelor	2003	Springer London
Machine vision for the food industry	J. P. Chan; B. G. Batchelor	Food Process Monitoring Systems	A. C. Pinder; G. Godfrey	1993	Springer US
Robot vision system programmed in Prolog	B. G. Batchelor and R. Hack	Machine vision applications, architectures, and systems integration IV: 23-24 October, 1995, Philadelphia, Pennsylvania /	Batchelor, Bruce G.; Solomon, Susan Snell.; Waltz, Frederick M.	[1995], ©1995.	SPIE,
Circle detection algorithm for counting canes in a bundle	W. Yeong and B. G. Batchelor	Intelligent robots and computer vision XXII: algorithms, techniques, and active vision: 25-27 October, 2004, Philadelphia, Pennsylvania, USA /	Casasent, D. P.; Hall, Ernest L.; Röning, Juha.	[2004], ©2004.	SPIE,
2D packing using the Myriad framework	L. T. Chatburn and B. G. Batchelor	Two- and three-dimensional vision systems for inspection, control, and metrology: 29-30 October 2003, Providence, Rhode Island, USA /	Batchelor, Bruce G.; Hügli, Heinz.	[2004], ©2004.	SPIE,
Keynote Address: Ethical, environmental, and social issues for machine vision in manufacturing industry	B. G. Batchelor and P. F. Whelan	Machine vision applications, architectures, and systems integration IV: 23-24 October, 1995, Philadelphia, Pennsylvania /	Batchelor, Bruce G.; Solomon, Susan Snell.; Waltz, Frederick M.	[1995], ©1995.	SPIE,
Implementing full backtracking facilities for Prolog-based image processing	A. C. Jones and B. G. Batchelor	Machine vision applications, architectures, and systems integration IV: 23-24 October, 1995, Philadelphia, Pennsylvania /	Batchelor, Bruce G.; Solomon, Susan Snell.; Waltz, Frederick M.	[1995], ©1995.	SPIE,
Pattern Recognition in Electroencephalography	C. D. Binnie; G. F. Smith; B. G. Batchelor	Pattern Recognition: Ideas in Practice	Bruce G. Batchelor	1978	Springer US
High-speed image processing using the TMS320C40 parallel DSP chip	M. Graves, D. Riddoch and B. G. Batchelor	Machine vision applications, architectures, and systems integration IV: 23-24 October, 1995, Philadelphia, Pennsylvania /	Batchelor, Bruce G.; Solomon, Susan Snell.; Waltz, Frederick M.	[1995], ©1995.	SPIE,
Prolog-based prototyping software for machine vision	B. G. Batchelor, R. Hack and A. C. Jones	Machine vision applications, architectures, and systems integration V: 18-19 November 1996, Boston, Massachusetts /	Batchelor, Bruce G.; Solomon, Susan Snell.; Waltz, Frederick M.	[1996], ©1996.	SPIE,
Software implementation of the SKIPSM paradigm under PIP	R. Hack, F. M. Waltz and B. G. Batchelor	Machine vision applications, architectures, and systems integration VI: 15-16 October 1997, Pittsburgh, Pennsylvania /	Batchelor, Bruce G.; Solomon, Susan Snell.; Miller, John W. V.	[1997], ©1997.	SPIE,
Chapter	Author(s)	Book	Book Authors	Year	Publisher

Showing 1 to 20 of 28 entries