Robert G. Black; James Cummings-Saxton; Robert E. Unsworth; Brian E. Julius; Janet A. Gochman; Frederick W. Talcott

The Analysis, Communication, and Perception of Risk

B. John Garrick; Willard C. Gekler

Springer US

Jung Ho Yoon; Hyung-Suk Jung; Min Hwan Lee; Gun Hwan Kim; Seul Ji Song; Jun Yeong Seok; Kyung Jean Yoon; Cheol Seong Hwang; M.-P. Besland; J. Tranchant; E. Souchier; P. Moreau; S. Salmon; B. Corraze; E. Janod; L. Cario; Raúl Zazpe; Mariana Ungureanu; Roger Llopis; Federico Golmar; Pablo Stoliar; Félix Casanova; Luis Eduardo Hueso; C. Hermes; M. Wimmer; S. Menzel; K. Fleck; V. Rana; M. Salinga; U. Böttger; R. Bruchhaus; M. Wuttig; R. Waser; F. Lentz; C. Hermes; B. Rösgen; T. Selle; R. Bruchhaus; V. Rana; R. Waser; Astrid Marchewka; Stephan Menzel; Ulrich Böttger; Dr.-Ing. Rainer Waser; Brian Hoskins; Fabien Alibart; Dmitri Strukov; Luca Pellegrino; Nicola Manca; Teruo Kanki; Hidekazu Tanaka; Michele Biasotti; Emilio Bellingeri; Antonio Sergio Siri; Daniele Marré; Antonio Claudio M. Padilha; Gustavo Martini Dalpian; Alexandre Reily Rocha; Themistoklis Prodromakis; Iulia Salaoru; Ali Khiat; Christopher Toumazou; Ella M. Gale; A. Madhavan; G. Adam; F. Alibart; L. Gao; D. B. Strukov; D. Wamwangi; W. Welnic; M. Wuttig; Behrad Gholipour; Chung-Che Huang; Alexandros Anastasopoulos; Feras Al-Saab; Brian E. Hayden; Daniel W. Hewak; Rui Lan; Rie Endo; Masashi Kuwahara; Yoshinao Kobayashi; Masahiro Susa; Paul Baumeister; Daniel Wortmann; Stefan Blügel; Riccardo Mazzarello; Yan Li; Wei Zhang; Ider Ronneberger; Ronnie Simon; Jens Gallus; Dimitrios Bessas; Ilya Sergueev; Hans-Christian Wille; Raphaël Pierre Hermann; Jennifer Luckas; Pascal Rausch; Daniel Krebs; Peter Zalden; Janika Boltz; Jean-Yves Raty; Martin Salinga; Christophe Longeaud; Matthias Wuttig; Haeri Kim; Dong-Wook Kim; Soo-Hyon Phark; Seungbum Hong; C. Park; A. Herpers; R. Bruchhaus; J. Verbeeck; R. Egoavil; F. Borgatti; G. Panaccione; F. Offi; R. Dittmann; Sergiu Clima; Kiroubanand Sankaran; Maarten Mees; Yang Yin Chen; Ludovic Goux; Bogdan Govoreanu; Dirk J. Wouters; Jorge Kittl; Malgorzata Jurczak; Geoffrey Pourtois; P. Calka; E. Martinez; V. Delaye; D. Lafond; G. Audoit; D. Mariolle; N. Chevalier; H. Grampeix; C. Cagli; V. Jousseaume; C. Guedj; Pragya Shrestha; Adaku Ochia; Kin. P. Cheung; Jason Campbell; Helmut Baumgart; Gary Harris; Malte Scherff; Bjoern Meyer; Julius Scholz; Joerg Hoffmann; Christian Jooss; Bo Xiao; Tomofumi Tada; Tingkun Gu; Arihiro Tawara; Satoshi Watanabe; Tai-Fa Young; Ya-Liang Yang; Ting-Chang Chang; Kuang-Ting Hsu; Chao-Yu Chen; A Burkert; I. Valov; G. Staikov; R. Waser; Jan van den Hurk; Ilia Valov; Rainer Waser; Ilia Valov; Stefan Tappertzhofen; Jan van der Hurk; Rainer Waser; G. Adam; F. Alibart; L. Gao; B. Hoskins; D. B. Strukov; Kyung Jean Yoon; Seul Ji Song; Gun Hwan Kim; Jun Yeong Seok; Jeong Ho Yoon; Cheol Seong Hwang; Jung Ho Yoon; Kyung Jin Yoon; Yao Shuai; Chuangui Wu; Wanli Zhang; Shengqiang Zhou; Danilo Bürger; Stefan Slesazeck; Thomas Mikolajick; Manfred Helm; Heidemarie Schmidt; Ella Gale; David Pearson; Stephen Kitson; Andrew Adamatzky; Ben de Lacy Costello; Eero Lehtonen; Jussi Poikonen; Mika Laiho; Pentti Kanerva; Hyungkwang Lim; Ho-won Jang; Doo Seok Jeong; Xun Cao; Meng Jiang; Feng Zhang; Xinjun Liu; Ping Jin; Kai Zhang; Madhavi Tangirala; Pragya Shrestha; Helmut Baumgart; Salinporn Kittiwatanakul; Jiwei Lu; Stuart Wolf; Venkateswara Pallem; Christian Dussarrat; S. Pinto; R. Krishna; C. Dias; G. Pimentel; G. N. P. Oliveira; J. M. Teixeira; P. Aguiar; E. Titus; J. Gracio; J. Ventura; J. P. Araujo

Frontiers in Electronic Materials - Correlation Effects, Spintronics, and Memristive Phenomena

Jörg Heber; Darrell Schlom; Yoshinori Tokura; Rainer Waser; Matthias Wuttig

John Wiley & Sons