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> C. H. Stapper, A. N. McLaren and M. Dreckmann
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Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product
C. H. Stapper, A. N. McLaren and M. Dreckmann
Manufacturing yield evaluation of VLSI/WSI systems /
Ciciani, Bruno.
1995.
IEEE Computer Society Press,
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