"D. M. Profunser, J. Vollmann and J. Dual" appeared in Books and Chapters

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"D. M. Profunser, J. Vollmann and J. Dual" appeared in Books and Chapters

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Chapter	Author(s)	Book	Book Authors	Year	Publisher
Mechanical characterization of thin membranes with picosecond ultrasound	D. M. Profunser, J. Vollmann and J. Dual	Microsystems engineering: metrology and inspection III: 23-25 June, 2003, Munich, Germany /	Gorecki, Christophe.	[2003], ©2003.	SPIE,
Mechanical wave propagation at phase and material interfaces of microstructures	J. Vollmann, D. M. Profunser, J. Goossens and J. Dual	Testing, reliability, and application of micro- and nano-material systems II: 15-17 March, 2004, San Diego, California, USA /	Meyendorf, Norbert.; Baaklini, George Y.; Michel, Bernd,	[2004], ©2004.	SPIE,
Ultrasonic wave propagation phenomena at material interfaces of microstructures	J. Vollmann, D. M. Profunser, A. H. Meier, J. Dual and M. Dobeli	Microsystems engineering: metrology and inspection III: 23-25 June, 2003, Munich, Germany /	Gorecki, Christophe.	[2003], ©2003.	SPIE,
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