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> D.R. Boys
"D.R. Boys" appeared in Books and Chapters
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Non-destructive identification of end-of-range damage in ion-implanted and annealed silicon
Yu. Shreter
;
J.H. Evans
;
B. Hamilton
;
A.R. Peaker
;
C. Hill
;
D.R. Boys
;
C.D. Meekison
;
G.R. Booker
Semiconductor Materials Analysis and Fabrication Process Control
G.M. Crean
;
R. Stuck and J.A. Woollam
1993
Elsevier
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