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> G. Hobi
"G. Hobi" appeared in Books and Chapters
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Comparison of Compositional Thin Film Depth Profiling Obtained by SIMS, IIR and AES
E. Hauser
;
G. Hobi
;
K. H. Guenther
;
E. Brandstaetter
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981
A. Benninghoven
;
J. Giber
;
J. Laszlo
;
M. Riedel
;
H.W. Werner
1982
Springer Berlin Heidelberg
A Novel Ion Etching Unit Applicable for Depth Profiling with SIMS and IIR
K. H. Guenther
;
E. Hauser
;
G. Hobi
;
P. G. Wierer
;
E. Brandstaetter
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981
A. Benninghoven
;
J. Giber
;
J. Laszlo
;
M. Riedel
;
H.W. Werner
1982
Springer Berlin Heidelberg
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