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> H. Cerva
"H. Cerva" appeared in Books and Chapters
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Year
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Microstructure and Interfaces of Polysilicon in Integrated Circuits
H. Cerva
;
H. Oppolzer
Polycrystalline Semiconductors: Grain Boundaries and Interfaces
Hans J. Möller
;
Horst P. Strunk
;
Jürgen H. Werner
1989
Springer Berlin Heidelberg
Semiconductors and Semiconductor Devices
H. Oppolzer
;
H. Cerva
Handbook of Microscopy - Applications in Material Science, Solid-State Physics and Chemistry Applications
S. Amelinckx
1996
John Wiley & Sons
Contrast Investigations of Surface Acoustic Waves by Stroboscopic Topography
H. Cerva
;
W. Geaeff
Volume 87, Number 2 February 16
Görlich
1985
De Gruyter
Contrast Investigations of Surface Acoustic Waves by Stroboscopic Topography
H. Cerva
;
W. Graeff
Volume 82, Number 1 March 16
Görlich
1984
De Gruyter
Dynamical multibeam simulation for (LA)CBED investigations of imperfect silicon
A Kenda
;
H Cerva
;
P Pongratz
Microscopy of Semiconducting Materials 2001: Proceedings of the Royal Microscopical Society Conference, Oxford University, 25–29 March 2001
A.G. Cullis
2001
Routledge
Damage in silicon after reactive ion etching
H P Strunk
;
H Cerva
;
E G Mohr
Microscopy of Semiconducting Materials, 1987
A.G. Cullis
1987
Routledge
Electron beam induced artefact during TEM and Auger analysis of multilayer dielectrics
H Cerva
;
T Hillmer
;
H Oppolzer
;
R v Criegern
Microscopy of Semiconducting Materials, 1987
A.G. Cullis
1987
Routledge
TEM studies during development of a 4-megabit DRAM
H Oppolzer
;
H Cerva
;
C Fruth
;
V Huber
;
S Schild
Microscopy of Semiconducting Materials, 1987
A.G. Cullis
1987
Routledge
Strain measurements of ULSI devices using LACBED with TSUPREM modeled displacements
A Kenda
;
H Cerva
;
P Pongratz
;
M Hierlemann
;
R Liebmann
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
A.G. Cullis
;
John L. Hutchison
2005
Springer Berlin Heidelberg
Round robin investigation of silicon oxide on silicon reference materials for ellipsometry
J. Vanhellemont
;
H.E. Maes
;
M. Schaekers
;
A. Armigliato
;
H. Cerva
;
A. Cullis
;
J. de Sande
;
H. Dinges
;
J. Hallais
;
V. Nayar
;
C. Pickering
;
J.-L. Stehlé
;
J. Van Landuyt
;
C. Walker
;
H. Werner
;
P. Salieri
Semiconductor Materials Analysis and Fabrication Process Control
G.M. Crean
;
R. Stuck and J.A. Woollam
1993
Elsevier
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