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> H. Oppolzer
"H. Oppolzer" appeared in Books and Chapters
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Showing 1 to 8 of 8 entries
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Microstructure and Interfaces of Polysilicon in Integrated Circuits
H. Cerva
;
H. Oppolzer
Polycrystalline Semiconductors: Grain Boundaries and Interfaces
Hans J. Möller
;
Horst P. Strunk
;
Jürgen H. Werner
1989
Springer Berlin Heidelberg
Semiconductors and Semiconductor Devices
H. Oppolzer
;
H. Cerva
Handbook of Microscopy - Applications in Material Science, Solid-State Physics and Chemistry Applications
S. Amelinckx
1996
John Wiley & Sons
Details of microstructure and geometrical configuration of integrated circuits studied by transmission electron microscopy
H Oppolzer
;
V Huber
Microscopy of Semiconducting Materials, 1983
A.G. Cullis
1983
Routledge
STEM-EDX Measurements on Grain Boundary Phenomena of Sensitized Chrome-Nickel Steels
Michael Pohl
;
H. Oppolzer
;
S. Schild
Progress in Materials Analysis: Vol. 1
M. Grasserbauer
;
M.K. Zacherl
1983
Springer Vienna
Experimentelle Fibrino-genopathie nach Reaktion von humanem Fibrinogen mit ß-Propiolacton: Anti- thrombinaktivität, Wirkung auf die Plättchenaggregation und Funktion und auf die Fibrinverfestigungsphase
H. Brunner
;
E. Wenzel
;
H. Holzhüter
;
R. Oppolzer
79. Kongreß: Wiesbaden, 29. April bis 3. Mai 1973
K. Miehlke
1973
J.F. Bergmann-Verlag
Electron beam induced artefact during TEM and Auger analysis of multilayer dielectrics
H Cerva
;
T Hillmer
;
H Oppolzer
;
R v Criegern
Microscopy of Semiconducting Materials, 1987
A.G. Cullis
1987
Routledge
TEM studies during development of a 4-megabit DRAM
H Oppolzer
;
H Cerva
;
C Fruth
;
V Huber
;
S Schild
Microscopy of Semiconducting Materials, 1987
A.G. Cullis
1987
Routledge
TEM investigation of thin oxides in MOS structures
P Pongratz
;
H Oppolzer
;
D Schmitt-Landsiedel
;
K Hofmann
;
G Dorda
;
P Skalicky
Microscopy of Semiconducting Materials, 1983
A.G. Cullis
1983
Routledge
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