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> Jeffery R. Price
"Jeffery R. Price" appeared in Books and Chapters
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Machine vision applications in industrial inspection XII: 21-22 January, 2004, San Jose, California, USA /
Price, Jeffery R.
;
Meriaudeau, Fabrice.
[2004], ©2004.
SPIE,
Machine vision applications in industrial inspection XI: 22-24 January, 2003, Santa Clara, California, USA /
Hunt, Martin A.
;
Price, Jeffery R.
[2003], ©2003.
SPIE,
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Image Informatics for Clinical and Preclinical Biomedical Analysis
Kenneth W. Tobin
;
Edward Chaum
;
Jens Gregor
;
Thomas P. Karnowski
;
Jeffery R. Price
;
Jonathan Wall
Computational Intelligence in Medical Imaging: Techniques and Applications
G. Schaefer
;
A. Hassanien
;
J. Jiang
2009
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