J. Wallner; F. Diermeyer; S. Engel

Advanced Vehicle Control AVEC\’16: Proceedings of the 13th International Symposium on Advanced Vehicle Control (AVEC&s; 16), September 13-16, 2016, Munich, Germany

Johannes Edelmann; Manfred Plöchl; Peter Pfeffer

2016

Routledge

S. J. Wallner-Liebmann; T. B. Grammer; R. Siekmeier; H. Mangge; W. März; Wilfried Renner

Neurobiology of Respiration

2013

Springer Netherlands

H. Arold; C. Liebmann; S. Reissmann; J. Scheidt

17. Prague, Czechoslovakia, August 29–September 3, 1982

Karel Bláha; Petr Maloň

1983

De Gruyter

Prosnitz L. R.; Goldenberg I. S.; Harris J. R.; Hellman S.; Danoff B. F.; Kramer S.; Wallner P. E.; Brady L. W.

Conservation Surgery and Radiation Therapy in the Treatment of Operable Breast Cancer: 17th Annual San Francisco Cancer Symposium, San Francisco, Calif. , February 1982

2015-01-01

S. Karger AG

Rebecca A. Clewell; Sanwat Chaudhuri; Steve Dickson; Rachael S. Cassady; William M. Wallner; J. Eric Eldridge et al.

Perchlorate in the Environment

2000

Springer US

Design and process integration for microelectronic manufacturing II [sic]: 26-27 February 2004, Santa Clara, California, USA /

[2004], ©2004.

SPIE,

Design and process integration for microelectronic manufacturing II: 26-28 February 2003, Santa Clara, California, USA /

[2003], ©2003.

SPIE,

S. Stille; Ch. Lenser; R. Dittmann; A. Köhl; I. Krug; R. Muenstermann; J. Perlich; C. M. Schneider; U. Klemradt; R. Waser; L. Plucinski; J. Minar; J. Braun; A. X. Gray; S. Ueda; Y. Yamashita; K. Kobayashi; H. Ebert; C.S Fadley; C.M Schneider; M. Sing; A. Müller; H. Boschker; F. Pfaff; G. Berner; S. Thiess; W. Drube; G. Koster; G. Rijnders; D.H.A Blank; M. Sing; R. Claessen; Haifeng Li; Alexander X. Gray; Jan Minár; Lukasz Plucinski; Mark Huijben; Alexander M. Kaiser; Slavomír Nemšák; Giuseppina Conti; Aaron Bostwick; Eli Rotenberg; See-Hun Yang; Jürgen Braun; Guus Rijnders; Dave H. A. Blank; Susanne Stemmer; Claus M. Schneider; Juergen Braun; Hubert Ebert; Charles S. Fadley; Carsten Woltmann; Hans Boschker; Rainer Jany; Christoph Richter; Jochen Mannhart; T. Heeg; W. Stein; Dieter Weber; Róza Võfély; Yuehua Chen; Ulrich Poppe; Irina Kärkkänen; Mikko Heikkilä; Jaakko Niinistö; Mikko Ritala; Markku Leskelä; Susanne Hoffmann-Eifert; Dr.-Ing. Rainer Waser; N. Aslam; M. Reiners; T. Blanquart; H. Mähne; J. Niinistö; M. Leskelä; Mikko Ritala; T. Mikolajick; S. Hoffmann-Eifert; R. Waser; Yoshihiko Togawa; Jun-ichiro Kishine; Alexander Ovchinnikov; Igor Proskurin; M. H. Lee; C. H. Chen; M.-W. Chu; H. D. Yang; Kilian Flöhr; H. Yusuf Günel; Kamil Sladek; Robert Frielinghaus; Hilde Hardtdegen; Marcus Liebmann; Thomas Schäpers; Markus Morgenstern; Tobias Salge; Igor Nemeth; Meiken Falke; Tadachika Nakayama; Roman Nowak; Koichi Niihara; Aleksey Maryasov; Stefan Herbert; Larissa Juschkin; Anke Aretz; Rainer Lebert; Sergey Seriy; Sabine Pütter; Alexandra Steffen; Markus Waschk; Alexander Weber; Stefan Mattauch; Thomas Brückel; H. Kim; S. Danylyuk; L. Juschkin; K. Bergmann; P. Loosen; Milias Crumbach; Manfred Martin

Frontiers in Electronic Materials - Correlation Effects, Spintronics, and Memristive Phenomena

Jörg Heber; Darrell Schlom; Yoshinori Tokura; Rainer Waser; Matthias Wuttig

2012

John Wiley & Sons

Honore Djieutedjeu; Kulugammana G. S. Ranmohotti; Nathan J. Takas; Julien P. A. Makongo; Xiaoyuan Zhou; Ctirad Uher; N. Haldolaarachchige; D. P. Young; Pierre F. P. Poudeu; O. Kirilmaz; M. Paul; A. Müller; D. Kufer; M. Sing; R. Claessen; S. Brück; C. Praetorius; K. Fauth; M. Kamp; P. Audehm; E. Goering; J. Verbeeck; H. Tian; G. Van Tendeloo; N. J. C. Ingle; M. Przybylski; M. Gorgoi; Bernal Iván; Gallego Silvia; Vikas Kashid; Vaishali Shah; H. G. Salunke; Y. Mokrousov; S. Blügel; Dirk Fuchs; Michael Merz; Levin Dieterle; Stefan Uebe; Peter Nagel; Stefan Schuppler; Dagmar Gerthsen; Hilbert von Löhneysen; Yoshihiko Togawa; Tsukasa Koyama; Shigeo Mori; Yusuke Kousaka; Jun Akimitsu; Sadafumi Nishihara; Katsuya Inoue; Alexander Ovchinnikov; Jun-Ichiro Kishine; Ramanathan Mahendiran; Y. Xiao; Y. Su; S. Nandi; S. Price; Th. Brückel; B. Zimmermann; P. Mavropoulos; S. Heers; N. H. Long; S. Blügel; Y. Mokrousov; Ersoy Sasioglu; Christoph Friedrich; Stefan Blügel; V. Moshnyaga; Christian Binek; Xi He; Yi Wang; N. Wu; Aleksander L. Wysocki; Takashi Komesu; Uday Lanke; Anthony N. Caruso; Elio Vescovo; Kirill D. Belashchenko; Peter A. Dowben; Daniel Sando; Arsène Agbelele; Christophe Daumont; Jean Juraszek; Maximilien Cazayous; Ingrid Infante; Wei Ren; Sergey Lisenkov; Cécile Carretero; Laurent Bellaiche; Brahim Dkhil; Agnès Barthélémy; Manuel Bibes; Xianzhong Zhou; Julius Mennig; Frank Matthes; Daniel E. Bürgler; Claus M. Schneider; Anja Herpers; Chanwoo Park; Ricardo Egoavil; Jo Verbeeck; Regina Dittmann; A. I. Kurbakov; I. A. Abdel-Latif; V. A. Trunov; H. U. Habermeier; A. Al-Hajry; A. L. Malyshev; V. A. Ulyanov; J. Kishine; A. S. Ovchinnikov; I. V. Proskurin; T. Saltzmann; S. Rieß; J. Kampmeier; G. Mussler; T. Stoica; B. Kardynal; U. Simon; H. Hardtdegen; C. Felser; L. Müchler; S. Chadov; B. Yan; J. Kübler; HJ Zhang; SC Zhang; Christian Pauly; Gustav Bihlmayer; Marcus Liebmann; Martin Grob; Alexander Georgi; Dinesh Subramaniam; Markus Scholz; Jaime Sánchez-Barriga; Andrei Varykhalov; Stefan Blügel; Oliver Rader; Markus Morgenstern; Irene Aguilera; Christoph Friedrich; Gustav Bihlmayer; Stefan Blügel; Konstantin Z. Rushchanskii; Felipe Garcia-Sanchez; Riccardo Hertel; Stefan Blügel; Marjana Ležaić; Veronica Goian; Stanislav Kamba; Christelle Kadlec; Petr Kužel; Konstantin Z. Rushchanskii; Marjana Ležaić; Roman V. Pisarev; C. R. Foschini; F. Moura; M. A. Ramirez; J. A. Varela; E. Longo; A. Z. Simões; Diana Iusan; Kunihiko Yamauchi; Kris Delaney; Silvia Picozzi; Jian Yu; Linlin Zhang; Xianbo Hou; Lluís. Yedra; Sònia Estradé; Eva. Pellicer; Moisés Cabo; Alberto López-Ortega; Marta Estrader; Josep Nogués; Dolors Baró; Zineb Saghi; Paul A. Midgley; Francesca Peiró; Vikas Kashid; Timo Schena; Bernd Zimmermann; Vaishali Shah; H. G. Salunke; Y. Mokrousov; S. Blügel

Frontiers in Electronic Materials - Correlation Effects, Spintronics, and Memristive Phenomena

Jörg Heber; Darrell Schlom; Yoshinori Tokura; Rainer Waser; Matthias Wuttig

2012

John Wiley & Sons