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> T. Kaga
"T. Kaga" appeared in Books and Chapters
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A New Filtering Method to Extract Repeated Defects (FIMER)
K. Imai and T. Kaga
IWSM: 1999 4th International Workshop on Statistical Metrology: June 12, 1999, Kyoto /
International Workshop on Statistical Metrology (4th 1999 Kyoto, Japan)
;
Institute of Electrical and Electronics Engineers
;
IEEE Electron Devices Society
[1999], ©1999.
IEEE,
A Few Examples of the Many Approaches to Salmon Resource Creation in Japan
E. Hasegawa
;
T. Saito
;
T. Kaga
;
T. Suzuki
Global Change: Mankind-Marine Environment Interactions: Proceedings of the 13th French-Japanese Oceanography Symposium
Hubert-Jean Ceccaldi
;
Ivan Dekeyser
;
Mathias Girault
;
Georges Stora
2011
Springer Netherlands
Enhancement of Cathodic Catalysis with an Intermediate Layer Deposited by Ultrasonic Mist Pyrolysis and Some Other Methods
A. Momma, Y. Kaga and T. Okuo
Solid oxide fuel cells VII: (SOFC VII): proceedings of the Seventh International Symposium /
Singhal, Subhash C.
;
Yokokawa, Harumi.
[2001], ©2001.
Electrochemical Society,
High Signal-to-Noise Ratio Inspection of Sub-Quarter Micrometer Oxide CMP Defects by using Laser Scattering Inspection Tool
K. Kato, A. Ueki and T. Kaga
IWSM: 1999 4th International Workshop on Statistical Metrology: June 12, 1999, Kyoto /
International Workshop on Statistical Metrology (4th 1999 Kyoto, Japan)
;
Institute of Electrical and Electronics Engineers
;
IEEE Electron Devices Society
[1999], ©1999.
IEEE,
Determination of three-dimensional directions of in situ stress from core discing
K. Matsuki
;
N. Kaga
;
T. Yokoyama
;
N. Tsuda
Rock Stress: Proceedings of the Third International Symposium on Rock Stress, Kumamoto, Japan, 4-6 November 2003
K. Sugawara
;
Y. Obara
;
A. Sato
2003
Routledge
Estimation of magnitudes of three-dimensional in situ stress from core discing
N. Kaga
;
K. Matsuki
;
T. Yokoyama
;
N. Tsuda
Rock Stress: Proceedings of the Third International Symposium on Rock Stress, Kumamoto, Japan, 4-6 November 2003
K. Sugawara
;
Y. Obara
;
A. Sato
2003
Routledge
Development of sample planning for wafer defect inspection
T. Nagai, A. Hamaguchi, Y. Yamazaki, M. Yamasaki and Y. Kaga
Characterization and metrology for ULSI technology /
Seiler, David G.
2005.
American Institute of Physics,
Mesoscopic Aggregation Control of Organic Fluorophores in Dewetted Thin Films
O. Karthaus
;
R. Chiba
;
T. Imai
;
K. Kaga
;
S. Kurimura
;
R. Nakamura et al.
Organic Nanophotonics
Fabrice Charra
;
Vladimir M. Agranovich
;
F. Kajzar
2003
Springer Netherlands
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