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> Tibor Steiner
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The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces
Helmut Pottmann
;
Tibor Steiner
;
Michael Hofer
;
Christoph Haider
;
Allan Hanbury
Computer Vision - ECCV 2004: 8th European Conference on Computer Vision, Prague, Czech Republic, May 11-14, 2004. Proceedings, Part IV
Tomás Pajdla
;
Jiří Matas
2004
Springer Berlin Heidelberg
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