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> W. Sigle
"W. Sigle" appeared in Books and Chapters
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Author(s)
Book
Book Authors
Year
Publisher
Microcharacterisation of Materials
F. Ernst
;
W. Sigle
High-Resolution Imaging and Spectrometry of Materials
Frank Ernst
;
Manfred Rühle
2003
Springer Berlin Heidelberg
The role of microanalysis in the characterization of interfaces
M Rühle
;
C Elsässer
;
C Scheu
;
W Sigle
Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000
D Williams
;
R Shimizu
2000
Routledge
Poster: Polar Dielectrics, Optics, and Ionics
Yu Jin Kim
;
Min Hyuk Park
;
Han Joon Kim
;
Doo Seok Jeong
;
Anquan Jiang
;
Cheol Seong Hwang
;
Sebastian Schmelzer
;
Ulrich Böttger
;
Dr.-Ing. Rainer Waser
;
X. Liu
;
H. Lu
;
J. D. Burton
;
Y. Wang
;
C. W. Bark
;
Y. Zhang
;
D. J. Kim
;
A. Stamm
;
P. Lukashev
;
D. A. Felker
;
C. M. Folkman
;
P. Gao
;
M. S. Rzchowski
;
X. Q. Pan
;
C. B. Eom
;
A. Gruverman
;
E. Y. Tsymbal
;
E. D. Politova
;
G. M. Kaleva
;
A. V. Mosunov
;
N. V. Sadovskaya
;
A. G. Segalla
;
Dipankar Mandal
;
Karsten Henkel
;
Suken Das
;
Dieter Schmeißer
;
K. S. Abdel Halim
;
M. H. Khedr
;
A. A. Farghali
;
M. I. Nasr
;
N. K. Soliman
;
Mehmet Onbasli
;
T. Goto
;
D. H. Kim
;
L. Bi
;
G. F. Dionne
;
C. A. Ross
;
Theodor Schneller
;
Simon Goodwin
;
Rainer Waser
;
Francesco Di Quarto
;
Francesco Di Franco
;
Monica Santamaria
;
Hongtao Yuan
;
Y. Ishida
;
K. Koizumi
;
H. Shimotani
;
K. Kanai
;
K. Akaike
;
Y. Kubozono
;
A. Tsukazaki
;
M. Kawasaki
;
S. Shin
;
Y. Iwasa
;
Roger A. De Souza
;
Veronika Metlenko
;
Henning Schraknepper
;
Amr Ramadan
;
B. O. H. Grope
;
S. Grieshammer
;
J. Koettgen
;
M. Martin
;
Taizo Shibuya
;
Kenji Yasuoka
;
Susanne Mirbt
;
Biplab Sanyal
;
Yoshitaka Aoki
;
Manfred Martin
;
R. Merkle
;
M. Shirpour
;
B. Rahmati
;
W. Sigle
;
P. A. van Aken
;
J. Maier
;
N. A. Sobolev
;
A. M. Azevedo
;
V. V. Bazarov
;
E. R. Zhiteytsev
;
R. I. Khaibullin
;
David Griesche
;
Theodor Schneller
;
Rainer Waser
;
Yusuke Otsuka
;
Christian Pithan
;
Jürgen Dornseiffer
;
Rainer Waser
;
H. Lustfeld
;
C. Pithan
;
M. Reißel
Frontiers in Electronic Materials - Correlation Effects, Spintronics, and Memristive Phenomena
Jörg Heber
;
Darrell Schlom
;
Yoshinori Tokura
;
Rainer Waser
;
Matthias Wuttig
2012
John Wiley & Sons
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