"A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs"

entries per page

Filter:

Showing 1 to 20 of 100 entries

Book	Author(s)	Year	Publisher
An introduction to surface analysis by XPS and AES	John F. Watts, John Wolstenholme	2003	J. Wiley
An Introduction to Surface Analysis by XPS and AES 2e	John F. Watts	2019	John Wiley & Sons
ATTACK vs SCAN: a comparison of endgame aircraft survivability computer programs	James Earl Parr	1980	Naval Postgraduate School
Matrix-computer methods in engineering	Louis Albert Pipes	1969	Wiley
Comparison of EMP and HERO programs	Willie R. C. Bogan	1988	Naval Postgraduate School;Available from National Technical Information Service
A comparison of computer warhead-target endgame simulations and recommendations pertaining to future endgame programs	Christopher Kenneth Fair	1981	Naval Postgraduate School
Surface Analysis of Polymers by XPS and Static SIMS	D. Briggs	1998-04	Cambridge University Press
Matrix computer analysis of structures	Moshe F. Rubinstein	1966	Prentice-Hall
Matrix computer analysis of structures	Moshe F. Rubinstein	1966	Prentice-Hall
Computer programs in oceanography.	C. Dinger	1970	National Oceanographic Data Center
A selection of geographical computer programs	Laurie Baker	1974	London School of Economics and Political Science, Department of Geography
A Theory of Supercritical Wing Sections, with Computer Programs and Examples: With Computer Programs and Examples	F. Bauer; P. Garabedian; D. Korn	1972	Springer Berlin Heidelberg
U. S. and Soviet space programs: a comparison	David E. Newton	1988	Franklin Watts
Matrix Computer Methods of Vibration Analysis	D. J. Hatter	1973	Butterworth-Heinemann
Structure and Interpretation of Computer Programs	Harold Abelson; Gerald Jay Sussman; Julie Sussman	1996	MIT Press
Structure and interpretation of computer programs	Harold Abelson; Gerald Jay Sussman; Julie Sussman	1985	MIT Press;McGraw-Hill
A comparison of EMG feedback and alternative anxiety treatment programs	Bryan A. Hiebert	1979
Live Data Structures in Logic Programs: Derivation by Means of Abstract Interpretation	Anne Mulkers	1993	Springer Berlin Heidelberg
Live data structures in logic programs: derivation by means of abstract interpretation /	Mulkers, Anne,	[1993], ©1993.	Springer-Verlag,
Designing Computer Programs	Jim Haigh	October 6, 1994	Butterworth-Heinemann
Boook	Author(s)	Year	Publisher

Showing 1 to 20 of 100 entries

entries per page

Filter:

Showing 1 to 20 of 100 entries

Chapter	Author(s)	Book	Book Authors	Year	Publisher
A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs	Alexander G. Fitzgerald	Modern Developments and Applications in Microbeam Analysis	Glyn Love; W.A.Patrick Nicholson; Aldo Armigliato	1998	Springer Vienna
by XPS and AES		An introduction to surface analysis by XPS and AES	John F. Watts, John Wolstenholme	2003	J. Wiley
265 Comparison of AES and XPS		Principles of Materials Characterization and Metrology	Kannan M. Krishnan	2021	Oxford University Press
17 Comparison of XPS and AES/ SAM		An introduction to surface analysis by XPS and AES	John F. Watts, John Wolstenholme	2003	J. Wiley
6 Comparison of XPS and AES with Other		An introduction to surface analysis by XPS and AES	John F. Watts, John Wolstenholme	2003	J. Wiley
Quantification in AES and XPS	M. P. Seah	Quantitative Microbeam Analysis: Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992. A NATO Advanced Study Institute.	A.G Fitzgerald	1993	Routledge
Comparison of XPS and AES with Other Analytical Techniques		An Introduction to Surface Analysis by XPS and AES 2e	John F. Watts	2019	John Wiley & Sons
Typical Applications of AES and XPS	Siegfried Hofmann	Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide	Siegfried Hofmann	2013	Springer Berlin Heidelberg
Instrumental Techniques for XPS and AES	Graham C. Smith	Surface Analysis by Electron Spectroscopy: Measurement and Interpretation	Graham C. Smith	1994	Springer US
Data Processing for AES and XPS	Graham C. Smith	Surface Analysis by Electron Spectroscopy: Measurement and Interpretation	Graham C. Smith	1994	Springer US
Encryption Time Comparison of AES on FPGA and Computer	Yasin Akman; Tarık Yerlikaya	Advances in Computational Science, Engineering and Information Technology: Proceedings of the Third International Conference on Computational Science, Engineering and Information Technology (CCSEIT-2013), KTO Karatay University, June 7-9, 2013, Konya, Turkey - Volume 1	Dhinaharan Nagamalai; Ashok Kumar; Annamalai Annamalai	2014	Springer International Publishing
Investigation of NiSi and Pd3Si Thin Films by AES and XPS	V. Atzrodt; Th. Wirth; H. Lange	Volume 62, Number 2 December 16	Görlich	1980	De Gruyter
Depth Profile and Interface Analysis of Thin Films by AES and XPS	H. J. Mathieu	Thin Film and Depth Profile Analysis	H. Oechsner	1984	Springer Berlin Heidelberg
Quanti cation of Surface and Near-Surface Composition by AES and XPS	John C. Riviere; Sverre Myhra	Handbook of Surface and Interface Analysis: Methods for Problem-Solving, Second Edition	John C. Riviere; Sverre Myhra	2009	Routledge
Uses of AES and XPS in Adhesion, Friction, and Wear Studies	K. Miyoshi	Surface diagnostics in tribology: fundamental principles and applications /	Miyoshi, Kazuhisa.; Chung, Yip-wah,	1993.	World Scientific,
58Design by Computer Programs		Boilers, Evaporators, and Condensers	Sadik Kakaç	1991	Wiley-Interscience
Combined SIMS, AES and XPS Study of CdxHg1-xTe	O. Ganschow; H. M. Nitz; L. Wiedmann; A. Benninghoven	Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979	A. Benninghoven; C.A. Jr. Evans; R.A. Powell; R. Shimizu; H.A. Storms	1979	Springer Berlin Heidelberg
Characterization of Anodic Oxide Layers by Sputter Profiling with AES and XPS	S. Hofmann; J. M. Sanz	Progress in Materials Analysis: Vol. 1	M. Grasserbauer; M.K. Zacherl	1983	Springer Vienna
Surface Analysis Techniques Related to AES and XPS	Siegfried Hofmann	Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide	Siegfried Hofmann	2013	Springer Berlin Heidelberg
Surface Analysis and Imaging, AES, XPS, SIMS, PEM		X-Ray Optics and Microanalysis 1992	P.B. Kenway; P.J. Duke	1993	Routledge
Chapter	Author(s)	Book	Book Authors	Year	Publisher

Showing 1 to 20 of 100 entries

"A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs" - similar Books and Chapters