"Design of a Capacitance Compensator for Deep Level Transient Spectroscopy Dlts"

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Book	Author(s)	Year	Publisher
Capacitance Spectroscopy of Semiconductors	Jian V. Li; Giorgio Ferrari	2018	Routledge
Analysis of radiation damaged and annealed gallium arsenide and indium phosphide solar cells using deep level transient spectroscopy	Joseph A. Bruening	1993	Naval Postgraduate School;Available from National Technical Information Service
Analysis of radiation damaged and annealed gallium arsenide and indium phosphide solar cells using deep level transient spectroscopy techniques	Dimas Pinzon	1991	Naval Postgraduate School;Available from the National Technical Information Service
High-Resolution Spectroscopy of Transient Molecules	Eizi Hirota	1985	Springer Berlin Heidelberg
High-resolution spectroscopy of transient molecules	Eiji Hirota	1985	Springer-Verlag
A revised design concept for the A-7E approach power compensator system	David Haley Finney	1973	Naval Postgraduate School
Landau Level Spectroscopy	G. LANDWEHR and E.I. RASHBA (Eds.)	1991	North-Holland
Design of Miniaturized Variable-Capacitance Electrostatic Energy Harvesters	Seyed Hossein Daneshvar; Mehmet Rasit Yuce; Jean-Michel Redouté	1st ed. 2022	Springer International Publishing
Design of Transient Protection Systems	Nihal Kularatna; Alistair Steyn Ross; Jayathu Fernando and Sisira James	2019	Elsevier
Core Level Spectroscopy of Solids	Frank de Groot; Akio Kotani	2008	Routledge
Design and investigation of a dive plane sliding mode compensator for an autonomous underwater vehicle	Joo-No Sur	1989	Naval Postgraduate School
Design considerations of a flow system for transient laser discharge experiments	Josef Stricker	1979	Naval Postgraduate School
Deep-Level Geodynamics	Dobretsov N.L.	January 1, 1998	Taylor & Francis
Far- and Deep-Ultraviolet Spectroscopy	Yukihiro Ozaki; Satoshi Kawata	2015	Springer Japan
Transient field visualization for ultra--wideband antenna design	David V. Adamiak	1999	Naval Postgraduate School;Available from National Technical Information Service
An analog simulation of a discrete compensator for a sampled-data system	Ralph Lindsay Enos	1960	Naval Postgraduate School
Trap Level Spectroscopy in Amorphous Semiconductors	Victor I. Mikla and Victor V. Mikla	2010	Elsevier
System-Level Design Methodologies for Telecommunication	Nicolas Sklavos; Michael Hübner; Diana Goehringer; Paris Kitsos	2014	Springer International Publishing
Multi-Level Simulation for VLSI Design	D.D. Hill; D.R. Coelho	1987	Springer US
Verification Techniques for System-Level Design	Masahiro Fujita; Indradeep Ghosh and Mukul Prasad	2008	Morgan Kaufmann
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Chapter	Author(s)	Book	Book Authors	Year	Publisher
Deep Level Transient Spectroscopy (DLTS)	Peter McLarty	Characterization Methods for Submicron MOSFETs	Hisham Haddara	1995	Springer US
4 Deep Level Transient Spectroscopy (DLTS)		Characterization of Silicon Processing (Materials Characterization)	Yale Strausser	1993	Newnes
Deep-Level Transient Spectroscopy	Johan Lauwaert; Samira Khelifi	Capacitance Spectroscopy of Semiconductors	Jian V. Li; Giorgio Ferrari	2018	Routledge
Deep Level Transient Spectroscopy		20. Electron Devices	John G. Webster (Editor)	1999	Wiley
Deep Level Transient Spectroscopy		Microelectronics Processing: Inorganic Materials Characterization	Lawrence A. Casper (Eds.)	1986	American Chemical Society
Deep Level Transient Spectroscopy		Solar Cells: New Aspects and Solutions	Leonid A. Kosyachenko (ed.)	2011	InTech
Radiotracer Deep Level Transient Spectroscopy	N. Achtziger; W. Witthuhn	Silicon Carbide: Recent Major Advances	Wolfgang J. Choyke; Hiroyuki Matsunami; Gerhard Pensl	2004	Springer Berlin Heidelberg
Local deep-level transient spectroscopy	Yasuo Cho	Scanning Nonlinear Dielectric Microscopy	Yasuo Cho	2020	Woodhead Publishing
131 Deep-level transient spectroscopy		Characterisation and Control of Defects in Semiconductors (Materials, Circuits and Devices)	Filip Tuomisto (editor)	2019	The Institution of Engineering and Technology
7 - Scanning Deep Level Transient Spectroscopy	O. BREITENSTEIN; J. HEYDENREICH	SEM Microcharacterization of Semiconductors	D.B. HOLT; D.C. JOY	1989	Academic Press
Deep Level Transient Spectroscopy in TiO2: Nb	C. N. Duckworth; A.W. Brinkman; J. Woods	Volume 75, Number 1 January 16	Görlich	1983	De Gruyter
DLTS Capacitance Studies on Deep Level Centres in VPE GaP: N	O. Breitenstein; B. Rheinländer; R. Bindemann	Volume 51, Number 1 January 16	Görlich	1979	De Gruyter
Deep Level Transient Spectroscopy: A Case Study on GaAs		Characterization in compound semiconductor processing /	Strausser, Yale.; McGuire, G. E.	[1995], ©1995.	Manning,
Cascade compensator design for improving transient response		Control System Analysis and Design	Chandra, Dinesh; Tripathi, A. K	2014	New Academic Science
3. 2. 5 Deep Level Transient Spectroscopy. 76		Characterization and integration of defect-mediated photodetectors for silicon photonic circuits: Ph. D. Thesis - Department of Engineering Physics, McMaster University, Hamilton, Canada	Jonathan Kristopher Doylend	2011	Library and Archives of Canada
Deep Level Transient Spectroscopy for Semiconductor Surface and Interface Analysis	E. Rosencher	Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987	Guy LeLay; Jacques Derrien; Nino Boccara	1987	Springer Berlin Heidelberg
Defect Investigation in Perovskite Solar Cells by the Charge Based Deep Level Transient Spectroscopy (Q-DLTS)	K. Xue; C. Renaud; P. Y. Chen; S. H. Yang; T. P. Nguyen	Advances in Engineering Research and Application: Proceedings of the International Conference, ICERA 2018	Hamido Fujita; Duy Cuong Nguyen; Ngoc Pi Vu; Tien Long Banh; Hermann Horst Puta	1st ed. 2019	Springer International Publishing
level compensator	Martin H. Weik	Computer Science and Communications Dictionary	Martin Weik	2001	Springer US
3. 2. 4 Capacitance Transient Spectroscopy 68		Characterization and integration of defect-mediated photodetectors for silicon photonic circuits: Ph. D. Thesis - Department of Engineering Physics, McMaster University, Hamilton, Canada	Jonathan Kristopher Doylend	2011	Library and Archives of Canada
Analysis of DLTS Curves of Aggregated Deep Level Impurities	K. Žďánský; N. T. Thuchien	Volume 85, Number 1 September 16, 1984		1984	De Gruyter
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