"High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test"

entries per page

Filter:

Showing 1 to 20 of 100 entries

Book	Author(s)	Year	Publisher
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test	R. Dean Adams	2003	Springer US
Self-testing VLSI design /	I͡Armolik, V. N.; Kachan, I. V.	1993.	Elsevier,
Self-checking and fault-tolerant digital design /	Lala, Parag K.,	[2001], ©2001.	Morgan Kaufmann,
High Performance Memory Systems	Haldun Hadimioglu	2004	Springer New York;Imprint;Springer
High Performance Memory Systems	Haldun Hadimioglu; Jeffrey Kuskin; Josep Torrellas; David Kaeli; Ashwini Nanda	2004	Springer New York
Design, Modeling and Testing of Data Converters	Paolo Carbone; Sayfe Kiaei; Fang Xu	2014	Springer Berlin Heidelberg
Fault-Tolerance Techniques for High-Performance Computing	Thomas Herault, Yves Robert (eds.)	2015	Springer International Publishing
Fault-Tolerance Techniques for High-Performance Computing	Thomas Herault; Yves Robert	2015	Springer International Publishing
High voltage: measurement, testing, and design	T. J. Gallagher	1983	Wiley
Principles of High-Performance Processor Design: For High Performance Computing, Deep Neural Networks and Data Science	Junichiro Makino	1st ed. 2021	Springer International Publishing
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns	Said Hamdioui	2004	Springer US
High performance through self-management	Peggy Santamaria	1996	Rosen Pub. Group;Rosen Publishing Group
Electronic testing and fault diagnosis /	Loveday, George.	[1995], ©1995.	Longman Scientific & Technical,
Electronic testing and fault diagnosis	George Loveday	1980	Pitman
Design Driven Testing: Test Smarter, Not Harder	Matt Stephens; Doug Rosenberg	1st ed.	Apress
High Performance Data Network Design	Tony Kenyon	2002	Butterworth-Heinemann
Physiological testing of the high-performance athlete	Howard A. Wenger; Green, Howard J. Ph. D.; J. Duncan Macdougall	1991	Human Kinetics Books
Principles of optimal design: modeling and computation	Panos Y. Papalambros; Douglas J. Wilde	1988	Cambridge University Press
High Performance Self-Consolidating Cementitious Composites	Ganesh Babu Kodeboyina	2018	Routledge
Database modeling & design: the fundamental principles /	Teorey, Toby J.	[1994], ©1994.	Morgan Kaufmann Publishers,
Boook	Author(s)	Year	Publisher

Showing 1 to 20 of 100 entries

entries per page

Filter:

Showing 1 to 20 of 100 entries

Chapter	Author(s)	Book	Book Authors	Year	Publisher
Memory Fault Modeling and Testing		Semiconductor Memories: Technology, Testing, and Reliability	Ashok K. Sharma	1997	Wiley-IEEE Press
Fault Modeling, Testing, and Design for Testability	Kai Hu; Krishnendu Chakrabarty; Tsung-Yi Ho	Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips: Design Automation, Testing, and Design-for-Testability	Kai Hu; Krishnendu Chakrabarty; Tsung-Yi Ho	1st ed. 2017	Springer International Publishing
Memory Testing and Built-In Self-Test	Chen-Wen Wu	VLSI Test Principles and Architectures	Laung-Terng Wang; Cheng-Wen Wu and Xiaoqing Wen	2006	Morgan Kaufmann
HiperTM: High Performance, Fault-Tolerant Transactional Memory	Sachin Hirve; Roberto Palmieri; Binoy Ravindran	Distributed Computing and Networking: 15th International Conference, ICDCN 2014, Coimbatore, India, January 4-7, 2014, Proceedings	Mainak Chatterjee; Jian-nong Cao; Kishore Kothapalli; Sergio Rajsbaum	2013	Springer Berlin Heidelberg
Fault Modeling, Structural Testing, and Functional Testing	Zipeng Li; Krishnendu Chakrabarty; Tsung-Yi Ho; Chen-Yi Lee	Micro-Electrode-Dot-Array Digital Microfluidic Biochips: Design Automation, Optimization, and Test Techniques	Zipeng Li; Krishnendu Chakrabarty; Tsung-Yi Ho; Chen-Yi Lee	1st ed. 2019	Springer International Publishing
Testing and Fault-Tolerant Design	Paul Pop; Wajid Hassan Minhass; Jan Madsen	Microfluidic Very Large Scale Integration (VLSI): Modeling, Simulation, Testing, Compilation and Physical Synthesis	Paul Pop; Wajid Hassan Minhass; Jan Madsen	1st ed. 2016	Springer International Publishing
Performance testing and performance test codes		Proceedings of the ASME Power Conference, 2006: presented at the 2006 ASME Power Conference: May 2-4, 2006, Atlanta, Georgia, USA	ASME Power Conference (2006 Atlanta, Ga.)	2006	American Society of Mechanical Engineers
Performance testing and performance test codes		Proceedings of the ASME Power Conference--2007: presented at the 2007 ASME Power Conference, July 17-19, 2007, San Antonio, Texas, USA	ASME Power Conference (2007 San Antonio, Tex.)	2007	American Society of Mechanical Engineers
Performance testing and performance test codes.		Proceedings of the ASME Power Conference--2010: presented at the ASME 2010 Power Conference, July 13-15, 2010, Chicago, Illinois, USA	ASME Power Conference (2010 Chicago, Ill.)	2010	American Society of Mechanical Engineers
High-Performance Tool for the Test of Long-Memory and Self-Similarity	Al-Sakib Khan Pathan; Muhammad Mostafa Monowar; Shafiullah Khan	Simulation Technologies in Networking and Communications: Selecting the Best Tool for the Test	Al-Sakib Khan Pathan; Muhammad Mostafa Monowar; Shafiullah Khan	2014	Routledge
472 Memory Test Fault Model		Design-For-Test For Digital IC's And Embedded Core Systems	Alfred Crouch	1999	Prentice Hall
Signal Integrity: Fault Modeling and Testing in High-Speed SoCs	Mehrdad Nourani; Amir Attarha; Krishnendu Chakrabarty	SOC (System-on-a-Chip) Testing for Plug and Play Test Automation	Krishnendu Chakrabarty	2002	Springer US
Design Issues in High Performance Fault-Tolerant Multicomputers	David A. Rennels	Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems: 3. Internationale GI/ITG/GMA-Fachtagung / 3rd International GI/ITG/GMA Conference Bremerhaven, 9. –11. September 1987	Fevzi Belli; Winfried Görke	1987	Springer Berlin Heidelberg
Testing Memory Subsystem Performance		Optimizing HPC Applications with Intel Cluster Tools	Supalov, Alexander; Semin, Andrey; Klemm, Michael; Dahnken, Christopher	2014
High-Performance Design	Haishi Bai	Zen of Cloud: Learning Cloud Computing by Examples on Microsoft Azure	Haishi Bai	2014	Routledge
Electromagnetic testing self-test		Electromagnetic testing	Hussein Sadek	2013	The American Society for Nondestructive Testing, Inc.
Design principles and unit testing		Clean Code in Python: Develop maintainable and efficient code, 2nd Edition	Mariano Anaya	0	Packt Publishing
Design principles and unit testing		Clean Code in Python: Develop maintainable and efficient code, 2nd Edition	Mariano Anaya	2021	Packt Publishing Ltd
Design principles and unit testing		Clean Code in Python	Mariano Anaya	2018	Packt
Reconfigurable CPU Cache Memory Design: Fault Tolerance and Performance Evaluation	Haridimos T. Vergos; Dimitris Nikolos; Petros Mitsiadis; Chrisovalantis Kavousianos	VLSI: Integrated Systems on Silicon: IFIP TC10 WG10. 5 International Conference on Very Large Scale Integration 26–30 August 1997, Gramado, RS, Brazil	Ricardo A. Reis; Luc Claesen	1997	Springer US
Chapter	Author(s)	Book	Book Authors	Year	Publisher

Showing 1 to 20 of 100 entries

"High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test" - similar Books and Chapters