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"Integrated Circuit Defect-Sensitivity: Theory and Computational Models" - similar Books and Chapters
Showing 1 to 20 of 100 entries
Book | Author(s) | Year | Publisher |
1993 | Springer US | ||
1984 | Tab Books | ||
1975 | Wiley | ||
1989 | |||
2016 | Routledge | ||
2021 | Routledge | ||
1987 | Macmillan Education UK | ||
1987 | Springer New York | ||
1979 | H. W. Sams | ||
1995 | Newnes | ||
2008 | Gabler Verlag | ||
1993 | Springer Vienna | ||
1995 | Routledge | ||
[1995], ©1995. | M. Dekker, | ||
1990 | Springer US | ||
1975 | McGraw-Hill | ||
1990 | Springer US | ||
2002 | Society for Industrial and Applied Mathematics | ||
1973 | Butterworth-Heinemann | ||
1997 | John Wiley & Sons | ||
Boook | Author(s) | Year | Publisher |
Showing 1 to 20 of 100 entries
Chapter | Author(s) | Book | Book Authors | Year | Publisher |
1993 | Springer US | ||||
2008-04 | Cambridge University Press | ||||
1997 | Springer US | ||||
2015 | CRC Press | ||||
2nd ed. 2011 | Springer US | ||||
2004 | Routledge | ||||
2001 | Springer US | ||||
2016 | Oxford University Press | ||||
2016 | O'Reilly Media | ||||
2020 | O’Reilly Media, Inc. | ||||
1st ed. 2018 | Springer International Publishing | ||||
2015 | 12-Story Library | ||||
1995 | Gale | ||||
2018 | Packt Publishing Ltd | ||||
0 | |||||
c2009. | Wiley, | ||||
2015 | Momentum Press | ||||
2006 | John Wiley & Sons | ||||
1987 | Springer US | ||||
2014 | McGraw-Hill | ||||
Chapter | Author(s) | Book | Book Authors | Year | Publisher |