"Intelligent Tracking Control System for Fast Image Scanning of Atomic Force Microscopes"

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Book	Author(s)	Year	Publisher
Atomic Force Microscopy/Scanning Tunneling Microscopy	M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody	1994	Springer US
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy	Bert Voigtländer	2015	Springer Berlin Heidelberg
Atomic Force Microscopy/Scanning Tunneling Microscopy 3	Samuel H. Cohen; Marcia L. Lightbody	2002	Springer US
Atomic Force Microscopy/Scanning Tunneling Microscopy 2	Samuel H. Cohen; Marcia L. Lightbody	1997	Springer US
Intelligent Systems: Fusion, Tracking and Control (CSI, Control and Signal Image Processing Series)	G. W. Ng (GeeWah Ng)	2003	Research Studies Press Ltd
Integrated System for Intelligent Control	Ming Rao	1992	Springer Berlin Heidelberg
Image scanning for desktop publishers	Gary Glover	1990	Windcrest
Fast Scanning Calorimetry	Christoph Schick; Vincent Mathot	1st ed. 2016	Springer International Publishing
Scanning force microscopy: with applications to electric, magnetic, and atomic forces /	Sarid, Dror.	1994.	Oxford University Press,
Intelligent Seam Tracking for Robotic Welding	Nitin R. Nayak; Asok Ray	1993	Springer London
Intelligent seam tracking for robotic welding	Nitin Nayak	1993	Springer-Verlag
Scanning Force Microscopy of Polymers	G. Julius Vancso; Holger Schönherr	2010	Springer Berlin Heidelberg
Scanning Force Microscopy of Polymers	Holger Schönherr, G. Julius Vancso (auth.)	2010	Springer-Verlag Berlin Heidelberg
Scanning Probe Microscopes: Applications in Science and Technology	K. S. Birdi	2003	Routledge
Document Image Processing for Scanning and Printing	Ilia V. Safonov; Ilya V. Kurilin; Michael N. Rychagov; Ekaterina V. Tolstaya	1st ed. 2019	Springer International Publishing
Scanning and image processing for the PC	Frank Baeseler	1993	McGraw-Hill Bk. Co.
Atomic Force Microscopy	Peter Eaton; Paul West	2010	Oxford University Press
Atomic Force Microscopy	Bert Voigtländer	2nd ed. 2019	Springer International Publishing
Biomedical Image Analysis: Tracking	Scott T. Acton; Nilanjan Ray		Springer International Publishing
Electrical Atomic Force Microscopy for Nanoelectronics	Umberto Celano	1st ed. 2019	Springer International Publishing
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Chapter	Author(s)	Book	Book Authors	Year	Publisher
Intelligent Tracking Control System for Fast Image Scanning of Atomic Force Microscopes	Sajal K. Das; Hemanshu R. Pota; Ian R. Petersen	Chaos Modeling and Control Systems Design	Ahmad Taher Azar; Sundarapandian Vaidyanathan	2015	Springer International Publishing
Advanced Control of Atomic Force Microscope for Faster Image Scanning	M. S. Rana; H. R. Pota; I. R. Petersen	Applied Methods and Techniques for Mechatronic Systems: Modelling, Identification and Control	Lei Liu; Quanmin Zhu; Lei Cheng; Yongji Wang; Dongya Zhao	2014	Springer Berlin Heidelberg
Calibration Procedures for Atomic Force Microscopes	Anders Kühle	Advanced Techniques for Assessment Surface Topography	Liam Blunt and Xiangqian Jiang	2003	Kogan Page Science
Biological Application of Fast-Scanning Atomic Force Microscopy	Yuki Suzuki; Masatoshi Yokokawa; Shige H. Yoshimura; Kunio Takeyasu	Scanning Probe Microscopy in Nanoscience and Nanotechnology 2	Bharat Bhushan	2011	Springer Berlin Heidelberg
Biosensors Using Atomic Force Microscopes	Suijian Qi; Changqing Yi; Mengsu Yang	Encyclopedia of Microfluidics and Nanofluidics	Dongqing Li	2nd ed. 2015	Springer New York
Biosensors Using Atomic Force Microscopes	Suijian Qi; Changqing Yi; Mengsu Yang	Encyclopedia of Microfluidics and Nanofluidics	Dongqing Li	2008	Springer US
Biosensors Using Atomic Force Microscopes	Suijian Qi; Changqing Yi; Mengsu Yang	Encyclopedia of Microfluidics and Nanofluidics	Dongqing Li	0th ed. 2020	Springer Berlin Heidelberg
Image Formation in Scanning Microscopes		Encyclopedia of modern optics	Duncan G. Steel, Bob D. Guenther	2004	Academic Press
Scanning microscopes	David Whitehouse	Surfaces and Their Measurement	David Whitehouse	2002	Kogan Page Science
Systematic Analyses of Passive Vibration Isolation System for Atomic Force Microscopes	Shenghang Zhai; Peng Yu; Jialin Shi; Tie Yang; Lianqing Liu	Intelligent Robotics and Applications: 14th International Conference, ICIRA 2021, Yantai, China, October 22–25, 2021, Proceedings, Part II	Xin-Jun Liu; Zhenguo Nie; Jingjun Yu; Fugui Xie; Rui Song	1st ed. 2021	Springer International Publishing
Fast Scanning Force Microscopy		Encyclopedia of Biophysics	Gordon Roberts	2013	Springer Berlin Heidelberg
Fast Object Tracking in Intelligent Surveillance System	Ki-Yeol Eom; Tae-Ki Ahn; Gyu-Jin Kim; Gyu-Jin Jang; Moon-hyun Kim	Computational Science and Its Applications – ICCSA 2009: International Conference, Seoul, Korea, June 29--July 2, 2009, Proceedings, Part II	Osvaldo Gervasi; David Taniar; Beniamino Murgante; Antonio Laganà; Youngsong Mun	2009	Springer Berlin Heidelberg
Integrated Cantilevers and Atomic Force Microscopes	Sadik Hafizovic; Kay-Uwe Kirstein; Andreas Hierlemann	Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques	Bharat Bhushan; Harald Fuchs; Satoshi Kawata	2007	Springer Berlin Heidelberg
Force Sensors for Parallel Scanning Atomic Force Microscopy	D. Lange; O. Brand; H. Baltes	CMOS Cantilever Sensor Systems: Atomic Force Microscopy and Gas Sensing Applications	D. Lange; O. Brand; H. Baltes	2002	Springer Berlin Heidelberg
455 Scanning Probe Microscopes and Atomic Resolution		Foundations of Materials Science and Engineering	Willaim Smith, Javed Hashemi	2019	McGraw-Hill Education
Imaging surfaces with scanning tunnelling and scanning force microscopes	H J Butt	X-Ray Optics and Microanalysis 1992	P.B. Kenway; P.J. Duke	1993	Routledge
Scanning Probe Microscopes		nester's Microbiology A Hymen perspective ninth ed	Deborah Allen, Denise G. Anderson, and Sarah Salm	2018	McGraw Hill
Scanning Probe Microscopes		Nester's Microbiology: A Human Perspective	Deborah Allen, Denise G. Anderson, and Sarah Salm	2018	Deux Coqs d'or
B Scanning microscopes		Seeing the Light Optics in Nature, Photography, Color Vision, and Holography	David Falk, Dieter Brill, David Stork	2019	Echo Point Books & Media
Scanning Probe Microscopes	Waldemar Nawrocki	Introduction to Quantum Metrology: Quantum Standards and Instrumentation	Waldemar Nawrocki	2015	Springer International Publishing
Chapter	Author(s)	Book	Book Authors	Year	Publisher

Showing 1 to 20 of 100 entries

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