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"Soft X-Ray Scattering Characterization of Polymer Semiconductors" - similar Books and Chapters
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Book | Author(s) | Year | Publisher |
2007 | Springer Berlin Heidelberg | ||
2007 | Springer-Verlag Berlin Heidelberg | ||
2003 | Imperial College Pr | ||
2016 | Oxford University Press | ||
2000. | Oxford University Press, | ||
2015 | WSPC | ||
2004 | Oxford University Press | ||
1999 | John Wiley & Sons | ||
1994 | SPIE Optical Engineering Press | ||
2015 | Springer-Verlag Berlin Heidelberg | ||
2015 | Springer Berlin Heidelberg | ||
2002 | Springer Berlin Heidelberg | ||
1982 | Academic Press | ||
1984 | Springer Berlin Heidelberg | ||
1999 | Springer Berlin Heidelberg | ||
1996 | Springer US | ||
[1996], ©1996. | Plenum Press, | ||
1996 | Springer US | ||
2022 | Oxford University Press | ||
1st ed. 2017 | Springer Berlin Heidelberg | ||
Boook | Author(s) | Year | Publisher |
Showing 1 to 20 of 100 entries
Chapter | Author(s) | Book | Book Authors | Year | Publisher |
2019 | Routledge | ||||
2019 | Routledge | ||||
1992 | Springer Berlin Heidelberg | ||||
1994 | Springer US | ||||
1988 | Springer Berlin Heidelberg | ||||
2015 | John Wiley & Sons | ||||
2nd ed. 2020 | Springer International Publishing | ||||
0th ed. 2020 | Springer International Publishing | ||||
2013 | John Wiley & Sons | ||||
1984 | Springer Berlin Heidelberg | ||||
1999 | Springer Netherlands | ||||
2002 | Academic Press | ||||
2005 | Hackensack, NJ :, World Scientific | ||||
1973 | Clarendon Press | ||||
2001 | Elsevier | ||||
2001 | Elsevier | ||||
2017 | |||||
2014 | John Wiley & Sons | ||||
2003 | American Institute of Physics | ||||
1988 | Springer Berlin Heidelberg | ||||
Chapter | Author(s) | Book | Book Authors | Year | Publisher |