"Test Pattern Generation Methods and Algorithms"

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Book	Author(s)	Year	Publisher
High Quality Test Pattern Generation and Boolean Satisfiability	Stephan Eggersglüß; Rolf Drechsler	2012	Springer New York
Test Pattern Generation using Boolean Proof Engines	Rolf Drechsler; Stephan Eggersglüß; Görschwin Fey; Daniel Tille	2009	Springer Netherlands
Combining Pattern Classifiers: Methods and Algorithms, Second Edition	Ludmila I. Kuncheva	2014	John Wiley & Sons
Test pattern	Marjorie Klein	2000	Morrow
Pattern Matching Algorithms	Alberto Apostolico; Zvi Galil	1997	Oxford University Press
Automatic test pattern generation for logic circuits using the Boolean tree	Taegwon Jeong	1991
Grid Generation and Adaptive Algorithms	Marshall W. Bern; Joseph E. Flaherty; Mitchell Luskin	1999	Springer New York
Pattern Mining with Evolutionary Algorithms	Sebastián Ventura; José María Luna	1st ed. 2016	Springer International Publishing
Genetic Algorithms for Pattern Recognition	Sankar K. Pal; Frederick E. Petry; Paul P. Wang; Sanghamitra Bandyopadhyay; Sankar K. Pal; Hisao Ishibuchi; Cezary Janikow; A Verschoren; H. Van Hove; Matthew Lybanon; Mark G. Cooper; Jacques J. Vidal; C.A. Murthy; Susmita De; Ashish Ghosh; Michael Vose; Alden H Wright; L.M. Patnaik; M Srinivas; Keith Mathias; Darrell Whitley; Anthony Kusuma; Christof Stork; Benjamin W. Wah; Arthur Ieumwananonthachai; Yong-Cheng Li; Bill P. Buckles; D. Prabhu; Steve G. Romaniuk; Vincent Charles Gaudet; Tadahiko Murata; Hideo Tanaka	1996	Routledge
Genetic algorithms for pattern recognition /	Pal, Sankar K.; Wang, Paul P.	1996.	CRC Press,
Pattern recognition: architectures, algorithms & applications	Réjean Plamondon	1991	World Scientific
Randomized Algorithms: Approximation, Generation, and Counting	Russ Bubley	2001	Springer London
Combinatorial Algorithms: Generation, Enumeration, and Search	Donald L. Kreher; Douglas R. Stinson	1999	Routledge
Combinatorial algorithms: generation, enumeration, and search /	Kreher, Donald L.; Stinson, Douglas R.	[1999], ©1999.	CRC Press,
Periodic Pattern Mining: Theory, Algorithms, and Applications	R. Uday Kiran; Philippe Fournier-Viger; Jose M. Luna; Jerry Chun-Wei Lin; Anirban Mondal	1st ed. 2021	Springer Nature Singapore
Computer algorithms: string pattern matching strategies /	Aoe, Jun-ichi,	[1994], ©1994.	IEEE Computer Society Press,
Algorithms for Next Generation Networks	Graham Cormode; Marina Thottan	2010	Springer London
Algorithms for Next-Generation Sequencing	Wing-Kin Sung	2017	Routledge
Algorithms for blending surface generation	Peter Charles Filkins	1991	Available from the National Technical Information Service
Computational Optimization, Methods and Algorithms	Slawomir Koziel; Xin-She Yang	2011	Springer Berlin Heidelberg
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Chapter	Author(s)	Book	Book Authors	Year	Publisher
Test Pattern Generation Methods and Algorithms	Zainalabedin Navabi	Digital System Test and Testable Design: Using HDL Models and Architectures	Zainalabedin Navabi	2011	Springer US
Test Pattern Generation		A Designer’s Guide to Built-In Self-Test	Charles E. Stroud	2002	Springer US
Automatic Test Pattern Generation	Rolf Drechsler; Görschwin Fey	Formal Methods for Hardware Verification: 6th International School on Formal Methods for the Design of Computer, Communication, and Software Systems, SFM 2006, Bertinoro, Italy, May 22-27, 2006, Advances Lectures	Marco Bernardo; Alessandro Cimatti	2006	Springer Berlin Heidelberg
Automatic Test Pattern Generation	Kenneth M. Butler; M. Ray Mercer	Assessing Fault Model and Test Quality	Kenneth M. Butler; M. Ray Mercer	1992	Springer US
Automatic Test Pattern Generation	Kwang-Ting (Tim) Cheng; Li-C. Wang; Huawei Li; James Chien-Mo Li	Electronic Design Automation for IC System Design, Verification, and Testing	Luciano Lavagno; Igor L. Markov; Grant Martin; Louis K. Scheffer	2016	Routledge
Automatic Test Pattern Generation	Kwang-Ting (Tim) Cheng; Li-C. Wang	EDA for IC System Design, Verification, and Testing	Ahmed Jerraya; Louis Scheffer; Enrico Macii; Luciano Lavagno; Grant Martin; Ray Turner; Robert F. Damiano; Stephen A. Edwards; Kwang-Ting(Tim) Cheng; Marcello Coppola; Limor Fix; Steven Howard Leibson; Prabhat Mishra; Bozena Kaminska; Bernd Koenemann; Gaurav Singh; Alain Clouard; John Sanguinetti; Franz E. Marschner; Marco Di Natale; Ralph H. Otten; John Wilson; Miltos D. Grammatikakis; Wayne Wolf; Rajesh Gupta; Sumit Gupta; Sandeep Shukla; Vivek Tiwari; Renu Mehra; Massimo Poncino; Shuvra S. Bhattacharyya; Mike Bershteyn; Raul Camposano; Iuliana Bacivarov; Nikil Dutt; Kenneth L. McMillan; Li-Chung Wang; Harry D. Foster; Jean-Philippe Strassen; Frank Ghenassia; Laurent Maillet-Contoz; Joseph Tobin Buck; Naehyuck Chang	2006	Routledge
Automatic Test Pattern Generation		Digital Logic Test and Simulation, Second Edition	Alexander Miczo	2003	John Wiley & Sons
Deterministic Test Generation Algorithms	Zainalabedin Navabi	Digital System Test and Testable Design: Using HDL Models and Architectures	Zainalabedin Navabi	2011	Springer US
Test Pattern Generation and Fault Simulation		Integrated Circuit Test Engineering: Modern Techniques	Ian A. Grout	2006	Springer London
Low-Power Test Pattern Generation	Xiaoqing Wen; Seongmoon Wang	Power-Aware Testing and Test Strategies for Low Power Devices	Patrick Girard; Nicola Nicolici; Xiaoqing Wen	2010	Springer US
Fault-oriented test pattern generation		Digital system design with VHDL	Zwoliński, Mark	2004;2010	Pearson; Prentice-Hall
Basic Concepts and Test Generation Methods	René David	Random Testing of Digital Circuits: Theory and Applications	Rene David	1998	Routledge
Test pattern generation for analog circuits using neural networks and evolutive algorithms	J. L. Bernier; J. J. Merelo; J. Ortega; A. Prieto	From Natural to Artificial Neural Computation: International Workshop on Artificial Neural Networks, Malaga-Torremolinos, Spain, June 7 – 9, 1995 Proceedings	Jose Mira; Francisco Sandoval	1995	Springer Berlin Heidelberg
Embedding test pattern generation into design	W. Feiten; H. Hofestädt	Computer Aided Systems Theory - EUROCAST ' 89: A selection of papers from the International Workshop EUROCAST ' 89, Las Palmas, Spain, February 26 - March 4, 1989. Proceedings	Franz Pichler; Roberto Moreno-Diaz	1990	Springer Berlin Heidelberg
Automatic Test Pattern Generation with BOA	Tiziana Gravagnoli; Fabrizio Ferrandi; Pier Luca Lanzi; Donatella Sciuto	Parallel Problem Solving from Nature - PPSN IX: 9th International Conference, Reykjavik, Iceland, September 9-13, 2006, Proceedings	Thomas Philip Runarsson; Hans-Georg Beyer; Edmund Burke; Juan J. Merelo-Guervós; L. Darrell Whitley; Xin Yao	2006	Springer Berlin Heidelberg
113 Fault-Oriented Test Pattern Generation		Digital System Design with Systemverilog (Paperback) (Prentice Hall PTR Signal Integrity Library)	Mark Zwolinski	2016	Prentice Hall
Chapter 69 Automatic Test Pattern Generation		The VLSI handbook	Chen, Wai-Kai (ed.)	2007	Taylor et Francis; CRC Press
113 Fault-Oriented Test Pattern Generation		Digital system design with SystemVerilog	Zwoliński, Mark	2009;2010	Prentice Hall
2 Automatic Test Pattern Generation Fundamentals		Design-For-Test For Digital IC's And Embedded Core Systems	Alfred Crouch	1999	Prentice Hall
41 TEST PATTERN GENERATION FOR BIST		An Introduction to Logic Circuit Testing	Parag K. Lala	2008	Morgan and Claypool Publishers
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Showing 1 to 20 of 100 entries

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